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Field Emission Scanning Electron Microscopy = New Perspectives for Materials Characterization /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Field Emission Scanning Electron Microscopy/ by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
其他題名:	New Perspectives for Materials Characterization /
作者:	Brodusch, Nicolas.
其他作者:	Demers, Hendrix.
面頁冊數:	XII, 137 p. 53 illus., 20 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Materials science. -
電子資源:	https://doi.org/10.1007/978-981-10-4433-5
ISBN:	9789811044335

Field Emission Scanning Electron Microscopy = New Perspectives for Materials Characterization /
Brodusch, Nicolas.

Field Emission Scanning Electron MicroscopyNew Perspectives for Materials Characterization /[electronic resource] :by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin. - 1st ed. 2018. - XII, 137 p. 53 illus., 20 illus. in color.online resource. - SpringerBriefs in Applied Sciences and Technology,2191-530X. - SpringerBriefs in Applied Sciences and Technology,.

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.

ISBN: 9789811044335

Standard No.: 10.1007/978-981-10-4433-5doiSubjects--Topical Terms:

557839
Materials science.

LC Class. No.: TA404.6

Dewey Class. No.: 620.11

Field Emission Scanning Electron Microscopy = New Perspectives for Materials Characterization /
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