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Passive and Active Measurement = 20th International Conference, PAM 2019, Puerto Varas, Chile, March 27–29, 2019, Proceedings /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Passive and Active Measurement/ edited by David Choffnes, Marinho Barcellos.
Reminder of title:	20th International Conference, PAM 2019, Puerto Varas, Chile, March 27–29, 2019, Proceedings /
other author:	Choffnes, David.
Description:	XIII, 318 p. 161 illus., 109 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Computer communication systems. -
Online resource:	https://doi.org/10.1007/978-3-030-15986-3
ISBN:	9783030159863

Passive and Active Measurement = 20th International Conference, PAM 2019, Puerto Varas, Chile, March 27–29, 2019, Proceedings /
Passive and Active Measurement20th International Conference, PAM 2019, Puerto Varas, Chile, March 27–29, 2019, Proceedings /[electronic resource] :edited by David Choffnes, Marinho Barcellos. - 1st ed. 2019. - XIII, 318 p. 161 illus., 109 illus. in color.online resource. - Computer Communication Networks and Telecommunications ;11419. - Computer Communication Networks and Telecommunications ;8995.

This book constitutes the proceedings of the 20th International Conference on Passive and Active Measurement, PAM 2019, held in Puerto Varas, Chile, in March 2019. The 20 full papers presented were carefully reviewed and selected from 75 submissions. The papers cover a wide range of important networking measurement and analysis topics from low layers of the network stack up to applications, using measurements at scales large and small, and covering important aspects of the network ecosystem such as routing, DNS, privacy, security, and performance. They are organized in the following topical sections: mobile networks; measurement at Internet scale; measuremen at other scales; domain names; failures; security and privacy; and Web. .

ISBN: 9783030159863

Standard No.: 10.1007/978-3-030-15986-3doiSubjects--Topical Terms:

1115394
Computer communication systems.

LC Class. No.: TK5105.5-5105.9

Dewey Class. No.: 004.6

Passive and Active Measurement = 20th International Conference, PAM 2019, Puerto Varas, Chile, March 27–29, 2019, Proceedings /
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