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Introduction to Statistics in Metrology

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Introduction to Statistics in Metrology/ by Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin.
Author:	Crowder, Stephen.
other author:	Delker, Collin.
Description:	XXI, 347 p. 111 illus., 101 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Statistics . -
Online resource:	https://doi.org/10.1007/978-3-030-53329-8
ISBN:	9783030533298

Introduction to Statistics in Metrology
Crowder, Stephen.

Introduction to Statistics in Metrology[electronic resource] /by Stephen Crowder, Collin Delker, Eric Forrest, Nevin Martin. - 1st ed. 2020. - XXI, 347 p. 111 illus., 101 illus. in color.online resource.

1. Introduction -- 2. Basic Concepts -- 3. The International System of Units (SI), Traceability, and Calibration -- 4. Introduction to Statistics and Probability -- 5. Measurement Uncertainty in Decision Making -- 6. The Measurement Model and Uncertainty -- 7. Analytical Methods for the Propagation of Uncertainties -- 8. Monte Carlo Methods for the Propagation of Uncertainties -- 9. Determining Uncertainties in Fitted Curves -- 10. Design of Experiments in Metrology -- 11. Special Topics in Metrology -- 12. Summary and Acknowledgments.

This book provides an overview of the application of statistical methods to problems in metrology, with emphasis on modelling measurement processes and quantifying their associated uncertainties. It covers everything from fundamentals to more advanced special topics, each illustrated with case studies from the authors' work in the Nuclear Security Enterprise (NSE). The material provides readers with a solid understanding of how to apply the techniques to metrology studies in a wide variety of contexts. The volume offers particular attention to uncertainty in decision making, design of experiments (DOEx) and curve fitting, along with special topics such as statistical process control (SPC), assessment of binary measurement systems, and new results on sample size selection in metrology studies. The methodologies presented are supported with R script when appropriate, and the code has been made available for readers to use in their own applications. Designed to promote collaboration between statistics and metrology, this book will be of use to practitioners of metrology as well as students and researchers in statistics and engineering disciplines.

ISBN: 9783030533298

Standard No.: 10.1007/978-3-030-53329-8doiSubjects--Topical Terms:

1253516
Statistics .

LC Class. No.: QA276-280

Dewey Class. No.: 519.5

Introduction to Statistics in Metrology
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