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Design for Testability, Debug and Reliability = Next Generation Measures Using Formal Techniques /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Design for Testability, Debug and Reliability/ by Sebastian Huhn, Rolf Drechsler.
Reminder of title:	Next Generation Measures Using Formal Techniques /
Author:	Huhn, Sebastian.
other author:	Drechsler, Rolf.
Description:	XXI, 164 p. 47 illus., 25 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Electronic circuits. -
Online resource:	https://doi.org/10.1007/978-3-030-69209-4
ISBN:	9783030692094

Design for Testability, Debug and Reliability = Next Generation Measures Using Formal Techniques /
Huhn, Sebastian.

Design for Testability, Debug and ReliabilityNext Generation Measures Using Formal Techniques /[electronic resource] :by Sebastian Huhn, Rolf Drechsler. - 1st ed. 2021. - XXI, 164 p. 47 illus., 25 illus. in color.online resource.

Introduction -- Integrated Circuits -- Formal Techniques -- Embedded Compression Architecture for Test Access Ports -- Optimization SAT-based Retargeting for Embedded Compression -- Reconfigurable TAP Controllers with Embedded Compression -- Embedded Multichannel Test Compression for Low-Pin Count Test -- Enhanced Reliability using Formal Techniques -- Conclusion and Outlook.

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.

ISBN: 9783030692094

Standard No.: 10.1007/978-3-030-69209-4doiSubjects--Topical Terms:

563332
Electronic circuits.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Design for Testability, Debug and Reliability = Next Generation Measures Using Formal Techniques /
LDR:03326nam a22003975i 4500 001 1051763
003 DE-He213
005 20211125025808.0
007 cr nn 008mamaa
008 220103s2021 sz | s |||| 0|eng d
020 $a 9783030692094 $9 978-3-030-69209-4
024 7 $a 10.1007/978-3-030-69209-4 $2 doi
035 $a 978-3-030-69209-4
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
100 1 $a Huhn, Sebastian. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 1250012
245 1 0 $a Design for Testability, Debug and Reliability $h [electronic resource] : $b Next Generation Measures Using Formal Techniques / $c by Sebastian Huhn, Rolf Drechsler.
250 $a 1st ed. 2021.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2021.
300 $a XXI, 164 p. 47 illus., 25 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Introduction -- Integrated Circuits -- Formal Techniques -- Embedded Compression Architecture for Test Access Ports -- Optimization SAT-based Retargeting for Embedded Compression -- Reconfigurable TAP Controllers with Embedded Compression -- Embedded Multichannel Test Compression for Low-Pin Count Test -- Enhanced Reliability using Formal Techniques -- Conclusion and Outlook.
520 $a This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces. Provides readers with a combination of a comprehensive set of formal techniques covering and enhancing different aspects of the state-of-the-art design and test flow for ICs; Introduces newly developed heuristic, formal optimization-based and partition-based retargeting techniques and integrates them into a common framework; Describes fully compliant (with respect to industrial de-facto standard) measures to enhance the DFT, DFD and DFR capabilities while supporting standardized data exchange formats; Includes new measures to tackle shortcomings of existing state-of-the-art methods, including zero-defect enforcing safety-critical applications.
650 0 $a Electronic circuits. $3 563332
650 0 $a Microprocessors. $3 632481
650 1 4 $a Circuits and Systems. $3 670901
650 2 4 $a Processor Architectures. $3 669787
700 1 $a Drechsler, Rolf. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 670948
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030692087
776 0 8 $i Printed edition: $z 9783030692100
776 0 8 $i Printed edition: $z 9783030692117
856 4 0 $u https://doi.org/10.1007/978-3-030-69209-4
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)