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Extended defects in semiconductors =...

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Extended defects in semiconductors = electronic properties, device effects and structures /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Extended defects in semiconductors/ D.B. Holt and B.G. Yacobi.
Reminder of title:	electronic properties, device effects and structures /
Author:	Holt, D. B.
other author:	Yacobi, B. G.
Published:	Cambridge :Cambridge University Press, : 2007.,
Description:	xi, 631 p.
Subject:	Semiconductors - Failures. -
Online resource:	Click to View

Extended defects in semiconductors = electronic properties, device effects and structures /
Holt, D. B.

Extended defects in semiconductorselectronic properties, device effects and structures /[electronic resource] :D.B. Holt and B.G. Yacobi. - Cambridge :Cambridge University Press,2007. - xi, 631 p.

Includes bibliographical references.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

Subjects--Topical Terms:

670934
Semiconductors
--Failures.Index Terms--Genre/Form:

554714
Electronic books.

LC Class. No.: TK7871.852 / .H65 2007

Dewey Class. No.: 621.38152

Extended defects in semiconductors = electronic properties, device effects and structures /
LDR:01100nam 2200289Ia 4500 001 1072139
003 MiAaPQ
005 20200520144314.0
006 m o d |
007 cr cn|||||||||
008 221104s2007 enk sb 000 0 eng d
020 $z 9780521819343 (hbk.) :
020 $z 0521819342 (hbk.) :
035 $a (MiAaPQ)EBC293340
035 $a (Au-PeEL)EBL293340
035 $a (CaPaEBR)ebr10172492
035 $a (CaONFJC)MIL85051
035 $a (OCoLC)476054715
035 $a EBC293340
040 $a MiAaPQ $c MiAaPQ $d MiAaPQ
050 4 $a TK7871.852 $b .H65 2007
082 0 4 $a 621.38152 $2 22
100 1 $a Holt, D. B. $3 565445
245 1 0 $a Extended defects in semiconductors $h [electronic resource] : $b electronic properties, device effects and structures / $c D.B. Holt and B.G. Yacobi.
260 $a Cambridge : $b Cambridge University Press, $c 2007.
300 $a xi, 631 p.
504 $a Includes bibliographical references.
533 $a Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
650 0 $a Semiconductors $x Failures. $3 670934
650 0 $a Semiconductors $x Defects. $3 565446
655 4 $a Electronic books. $2 local $3 554714
700 1 $a Yacobi, B. G. $3 565447
710 2 $a ProQuest (Firm) $3 1133097
856 4 0 $u https://ebookcentral.proquest.com/lib/nfu/detail.action?docID=293340 $z Click to View

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