國立虎尾科技大學 |

Module Level Power Electronics and Photovoltaic Modules : = Thermal Reliability Evaluation.

Record Type:	Language materials, manuscript : Monograph/item
Title/Author:	Module Level Power Electronics and Photovoltaic Modules :/
Reminder of title:	Thermal Reliability Evaluation.
Author:	Afridi, Muhammad Zain Ul Abideen.
Description:	1 online resource (193 pages)
Notes:	Source: Dissertations Abstracts International, Volume: 85-02, Section: B.
Contained By:	Dissertations Abstracts International85-02B.
Subject:	Electrical engineering. -
Online resource:	click for full text (PQDT)
ISBN:	9798380109376

Module Level Power Electronics and Photovoltaic Modules : = Thermal Reliability Evaluation.
Afridi, Muhammad Zain Ul Abideen.

Module Level Power Electronics and Photovoltaic Modules :Thermal Reliability Evaluation. - 1 online resource (193 pages)

Source: Dissertations Abstracts International, Volume: 85-02, Section: B.

Thesis (Ph.D.)--Arizona State University, 2023.

Includes bibliographical references

This is a two-part thesis.Part-I:This work investigated the long-term reliability of a statistically significant number of two different commercial module-level power electronics (MLPE) devices using two input power profiles at high temperatures to estimate their reliability and service life in field-use conditions. Microinverters underwent a period of 15,000 accelerated stress hours, whereas the power optimizers underwent a period of 6,400 accelerated stress hours. None of the MLPE devices failed during the accelerated test; however, the optimizers degraded by about 1% in output efficiency. Based on their accelerated stress temperatures, the estimated field equivalent service life approximated using the Arrhenius model ranges between 24-48 years for microinverters and 39-73 years for optimizers, with a reliability of 74% and a lower one-sided confidence level of 95%. Furthermore, using the Weibull distribution model, the reliability and service lifetimes of MLPE devices are statistically analyzed. MLPE lifetimes estimated using Weibull slope and shape parameters with a 95% lower one-sided confidence level indicate a similar, or possibly exceeding, the 25-year lifetime of the associated photovoltaic (PV) modules.Part-II:This study investigated the impact of the hotspot stress test on glass-backsheet and glass-glass modules. Before the hotspot testing, both modules were pre-stressed using 600 thermal cycles (TC600) to represent decades of field-exposed modules experiencing hotspot effects in field-use conditions. The glass-glass module reached a hotspot temperature of nearly 200°C, whereas the glass-backsheet module's maximum hotspot temperature was almost 150°C. After the hotspot experiment, electroluminescence imaging showed that most of the cells in the glass-glass module appeared to have experienced significant damage. In contrast, the stressed cells in the glass-backsheet module appeared to have experienced insignificant damage. After the sequential stress testing (hotspot testing after TC600), the glass-glass module degraded by nearly 8.3% in maximum power, whereas the glass-backsheet module experienced 1.3% degradation. This study also incorporated hotspot endurance in fresh (without being subjected to prior TC600) glass-glass and glass-backsheet modules. The test outcome demonstrated that both module types exhibited marginal maximum power loss.

Electronic reproduction.
Ann Arbor, Mich. :
ProQuest,
2024

Mode of access: World Wide Web

ISBN: 9798380109376Subjects--Topical Terms:

596380
Electrical engineering.
Subjects--Index Terms:

Thermal reliabilityIndex Terms--Genre/Form:

554714
Electronic books.

Module Level Power Electronics and Photovoltaic Modules : = Thermal Reliability Evaluation.
LDR:03827ntm a22003977 4500 001 1149629
005 20241022112600.5
006 m o d
007 cr bn ---uuuuu
008 250605s2023 xx obm 000 0 eng d
020 $a 9798380109376
035 $a (MiAaPQ)AAI30566359
035 $a AAI30566359
040 $a MiAaPQ $b eng $c MiAaPQ $d NTU
100 1 $a Afridi, Muhammad Zain Ul Abideen. $3 1475939
245 1 0 $a Module Level Power Electronics and Photovoltaic Modules : $b Thermal Reliability Evaluation.
264 0 $c 2023
300 $a 1 online resource (193 pages)
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
500 $a Source: Dissertations Abstracts International, Volume: 85-02, Section: B.
500 $a Advisor: Tamizhmani, Govindasamy;Kiaei, Sayfe.
502 $a Thesis (Ph.D.)--Arizona State University, 2023.
504 $a Includes bibliographical references
520 $a This is a two-part thesis.Part-I:This work investigated the long-term reliability of a statistically significant number of two different commercial module-level power electronics (MLPE) devices using two input power profiles at high temperatures to estimate their reliability and service life in field-use conditions. Microinverters underwent a period of 15,000 accelerated stress hours, whereas the power optimizers underwent a period of 6,400 accelerated stress hours. None of the MLPE devices failed during the accelerated test; however, the optimizers degraded by about 1% in output efficiency. Based on their accelerated stress temperatures, the estimated field equivalent service life approximated using the Arrhenius model ranges between 24-48 years for microinverters and 39-73 years for optimizers, with a reliability of 74% and a lower one-sided confidence level of 95%. Furthermore, using the Weibull distribution model, the reliability and service lifetimes of MLPE devices are statistically analyzed. MLPE lifetimes estimated using Weibull slope and shape parameters with a 95% lower one-sided confidence level indicate a similar, or possibly exceeding, the 25-year lifetime of the associated photovoltaic (PV) modules.Part-II:This study investigated the impact of the hotspot stress test on glass-backsheet and glass-glass modules. Before the hotspot testing, both modules were pre-stressed using 600 thermal cycles (TC600) to represent decades of field-exposed modules experiencing hotspot effects in field-use conditions. The glass-glass module reached a hotspot temperature of nearly 200°C, whereas the glass-backsheet module's maximum hotspot temperature was almost 150°C. After the hotspot experiment, electroluminescence imaging showed that most of the cells in the glass-glass module appeared to have experienced significant damage. In contrast, the stressed cells in the glass-backsheet module appeared to have experienced insignificant damage. After the sequential stress testing (hotspot testing after TC600), the glass-glass module degraded by nearly 8.3% in maximum power, whereas the glass-backsheet module experienced 1.3% degradation. This study also incorporated hotspot endurance in fresh (without being subjected to prior TC600) glass-glass and glass-backsheet modules. The test outcome demonstrated that both module types exhibited marginal maximum power loss.
533 $a Electronic reproduction. $b Ann Arbor, Mich. : $c ProQuest, $d 2024
538 $a Mode of access: World Wide Web
650 4 $a Electrical engineering. $3 596380
650 4 $a Physical chemistry. $3 1148725
650 4 $a Alternative energy. $3 1241221
653 $a Thermal reliability
653 $a Photovoltaic modules
653 $a Power electronics
653 $a Glass-glass modules
653 $a Sequential stress testing
655 7 $a Electronic books. $2 local $3 554714
690 $a 0544
690 $a 0363
690 $a 0494
710 2 $a ProQuest Information and Learning Co. $3 1178819
710 2 $a Arizona State University. $b Electrical Engineering. $3 845389
773 0 $t Dissertations Abstracts International $g 85-02B.
856 4 0 $u http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=30566359 $z click for full text (PQDT)