以臨界角法結CCD影像擷取技術作表面形貌量測之研究 = Study on...
Zhen-Chin Lin

 

  • 以臨界角法結CCD影像擷取技術作表面形貌量測之研究 = Study on the surface profile measurement by uses of the critical angle method and a ccd camera.
  • Record Type: Language materials, printed : monographic
    Paralel Title: Study on the surface profile measurement by uses of the critical angle method and a ccd camera.
    Author: 林振勤,
    Secondary Intellectual Responsibility: 邱銘宏,
    Place of Publication: 雲林縣
    Published: 國立虎尾科技大學;
    Year of Publication: 民98[2009]
    Edition: 初版
    Description: 93面圖 : 30公分;
    Subject: CCD
    Subject: 臨界角
    Subject: 表面形貌
    Subject: Critical Angle
    Subject: Surface Profile
    Subject: a CCD Camera
    Online resource: http://cetd.lib.nfu.edu.tw/etdservice/view_metadata?etdun=U0028-2307200917475000
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T001226 圖書館B1F 博碩士論文專區 不流通(NON_CIR) 碩士論文(TM) TM 008.166M 4454 98 一般使用(Normal) On shelf 0
T001227 圖書館B1F 可外借論文區 不流通(NON_CIR) 一般圖書 008.166M 4454 98 一般使用(Normal) On shelf 0
  • 2 records • Pages 1 •
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