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Logic-timing simulation and the degr...
~
Valencia, Manuel.
Logic-timing simulation and the degradation delay model
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Logic-timing simulation and the degradation delay model/ Manuel J. Bellido, Jorge Juan, Manuel Valencia.
Author:
Bellido, Manuel J.,
other author:
Valencia, Manuel.
Published:
London :Imperial College Press ; : c2006.,
Description:
xvii, 267 p. :ill. :
Subject:
Metal oxide semiconductors, Complementary. -
Online resource:
http://ebooks.worldscinet.com/ISBN/9781860947360/9781860947360.shtml
ISBN:
1860947360 (electronic bk.)
Logic-timing simulation and the degradation delay model
Bellido, Manuel J.,1964-
Logic-timing simulation and the degradation delay model
[electronic resource] /Manuel J. Bellido, Jorge Juan, Manuel Valencia. - London :Imperial College Press ;c2006. - xvii, 267 p. :ill.
Includes bibliographical references (p. 251-263) and index.
ISBN: 1860947360 (electronic bk.)Subjects--Topical Terms:
596746
Metal oxide semiconductors, Complementary.
Index Terms--Genre/Form:
554714
Electronic books.
Dewey Class. No.: 621.3815
Logic-timing simulation and the degradation delay model
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1860947360 (electronic bk.)
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Bellido, Manuel J.,
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Logic-timing simulation and the degradation delay model
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Manuel J. Bellido, Jorge Juan, Manuel Valencia.
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[electronic resource] /
260
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London :
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Singapore :
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c2006.
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Imperial College Press ;
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Distributed by World Scientific,
300
$a
xvii, 267 p. :
$b
ill.
504
$a
Includes bibliographical references (p. 251-263) and index.
650
0
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Metal oxide semiconductors, Complementary.
$3
596746
650
0
$a
Integrated circuits
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Very large scale integration.
$3
563475
650
0
$a
Timing circuits.
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713651
655
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Electronic books.
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Valencia, Manuel.
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713653
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1
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Juan Chico, Jorge.
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713652
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World Scientific (Firm)
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713624
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http://ebooks.worldscinet.com/ISBN/9781860947360/9781860947360.shtml
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