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Nanoscale CMOS VLSI circuits : = des...
~
Kundu, Sandip.
Nanoscale CMOS VLSI circuits : = design for manufacturability /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Nanoscale CMOS VLSI circuits :/ Sandip Kundu, Aswin Sreedhar.
Reminder of title:
design for manufacturability /
remainder title:
Nanoscale complementary metal oxide semiconductor very large-scale integration circuits
Author:
Kundu, Sandip.
other author:
Sreedhar, Aswin.
Published:
New York :McGraw-Hill, : c2010.,
Description:
xv, 296 p. :ill. ; : 24 cm.;
Subject:
Metal oxide semiconductors, Complementary - Design and construction. -
ISBN:
9780071635196 (cloth) :
Nanoscale CMOS VLSI circuits : = design for manufacturability /
Kundu, Sandip.
Nanoscale CMOS VLSI circuits :
design for manufacturability /Nanoscale complementary metal oxide semiconductor very large-scale integration circuitsSandip Kundu, Aswin Sreedhar. - New York :McGraw-Hill,c2010. - xv, 296 p. :ill. ;24 cm.
Includes bibliographical references and index.
Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
ISBN: 9780071635196 (cloth) :NT3704
LCCN: 2010022678
Nat. Bib. No.: GBB011406bnbSubjects--Topical Terms:
564465
Metal oxide semiconductors, Complementary
--Design and construction.
LC Class. No.: TK7871.99.M44 / K84 2010
Dewey Class. No.: 621.39/5
Nanoscale CMOS VLSI circuits : = design for manufacturability /
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Sandip Kundu, Aswin Sreedhar.
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Nanoscale complementary metal oxide semiconductor very large-scale integration circuits
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Includes bibliographical references and index.
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Semiconductor manufacturing -- Process and device variability : analysis and modeling -- Manufacturing-aware physical design closure -- Metrology, manufacturing defects, and defect extraction -- Defect impact modeling and yield improvement techniques -- Physical design and reliability -- Design for manufacturability : tools and methodologies.
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