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Atom probe microscopy /

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Gault, Baptiste.

Atom probe microscopy /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Atom probe microscopy // Baptiste Gault ... [et al.].
other author:	Gault, Baptiste.
Published:	New York :Springer, : c2012.,
Description:	xxiii, 396 p. :ill. (some col.) ; : 24 cm.;
Subject:	Atomic force microscopy. -
ISBN:	9781461434351 (Cloth) :

Atom probe microscopy /
Atom probe microscopy /Baptiste Gault ... [et al.]. - New York :Springer,c2012. - xxiii, 396 p. :ill. (some col.) ;24 cm. - Springer series in materials science ;160.. - Springer series in materials science ;106..

Includes bibliographical references and index.

ISBN: 9781461434351 (Cloth) :NT5195

LCCN: 2012936826Subjects--Topical Terms:

655758
Atomic force microscopy.

LC Class. No.: QH212.A78 / A85 2012

Dewey Class. No.: 502.8/2

Atom probe microscopy /
LDR:00679cam a2200193 a 4500 001 757658
008 131011s2012 nyua rb 001 0 eng
010 $a 2012936826
020 $a 9781461434351 (Cloth) : $c NT5195
020 $a 1461434351 (Cloth)
020 $a 9781461434368 (e-ISBN)
035 $a 17239970
040 $a BTCTA $b eng $c BTCTA $d CAI $d YDXCP $d BWX $d OHX $d NDD $d DLC $c NFU
050 0 0 $a QH212.A78 $b A85 2012
082 0 0 $a 502.8/2 $2 23
245 0 0 $a Atom probe microscopy / $c Baptiste Gault ... [et al.].
260 # $a New York : $c c2012. $b Springer,
300 $a xxiii, 396 p. : $b ill. (some col.) ; $c 24 cm.
490 1 $a Springer series in materials science ; $v 160.
504 $a Includes bibliographical references and index.
650 # 0 $a Atomic force microscopy. $3 655758
650 # 0 $a Scanning probe microscopy. $3 677829
650 # 0 $a Atom-probe field ion microscopy. $3 883472
700 1 # $a Gault, Baptiste. $3 883471
830 0 $a Springer series in materials science ; $v 106. $3 881461

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502.82 A881 2012

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