High resolution electron microscopy ...
Dahmen, Ulrich.

 

  • High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
  • Record Type: Language materials, printed : Monograph/item
    Title/Author: High resolution electron microscopy of defects in materials :/ editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
    Reminder of title: symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
    other author: Dahmen, Ulrich.
    Published: Pittsburgh, Pa. :Materials Research Society, : c1990.,
    Description: xi, 391 p. :ill. ; : 24 cm.;
    Subject: High resolution electron microscopy - Congresses. -
    ISBN: 1558990720 (cloth) :
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  • 1 records • Pages 1 •
 
E040102 圖書館3F 書庫 一般圖書(BOOK) 一般圖書 620.11299 H638 1990 一般使用(Normal) On shelf 0
  • 1 records • Pages 1 •
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