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High resolution electron microscopy ...
~
Dahmen, Ulrich.
High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
High resolution electron microscopy of defects in materials :/ editors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
Reminder of title:
symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
other author:
Dahmen, Ulrich.
Published:
Pittsburgh, Pa. :Materials Research Society, : c1990.,
Description:
xi, 391 p. :ill. ; : 24 cm.;
Subject:
High resolution electron microscopy - Congresses. -
ISBN:
1558990720 (cloth) :
High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
High resolution electron microscopy of defects in materials :
symposium held April 16-18, 1990, San Francisco, California, U.S.A. /editors, Robert Sinclair, David J. Smith, Ulrich Dahmen. - Pittsburgh, Pa. :Materials Research Society,c1990. - xi, 391 p. :ill. ;24 cm. - Materials Research Society symposium proceedings,v. 1830272-9172 ;. - Materials Research Society symposia proceedings ;v. 1352..
Includes bibliographical references and indexes.
ISBN: 1558990720 (cloth) :NT1172
LCCN: 90041466 Subjects--Topical Terms:
975577
High resolution electron microscopy
--Congresses.
LC Class. No.: TA417.23 / .H53 1990
Dewey Class. No.: 620.1/1299
High resolution electron microscopy of defects in materials : = symposium held April 16-18, 1990, San Francisco, California, U.S.A. /
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