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Hot carrier degradation in semicondu...

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Hot carrier degradation in semiconductor devices

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Hot carrier degradation in semiconductor devices/ edited by Tibor Grasser.
other author:	Grasser, Tibor.
Published:	Cham :Springer International Publishing : : 2015.,
Description:	x, 517 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Hot carriers. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-08994-2
ISBN:	9783319089942 (electronic bk.)

Hot carrier degradation in semiconductor devices
Hot carrier degradation in semiconductor devices[electronic resource] /edited by Tibor Grasser. - Cham :Springer International Publishing :2015. - x, 517 p. :ill. (some col.), digital ;24 cm.

Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.

ISBN: 9783319089942 (electronic bk.)

Standard No.: 10.1007/978-3-319-08994-2doiSubjects--Topical Terms:

1063297
Hot carriers.

LC Class. No.: QC611.6.H67

Dewey Class. No.: 537.6226

Hot carrier degradation in semiconductor devices
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020 $a 9783319089935 (paper)
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245 0 0 $a Hot carrier degradation in semiconductor devices $h [electronic resource] / $c edited by Tibor Grasser.
260 $a Cham : $c 2015. $b Springer International Publishing : $b Imprint: Springer,
300 $a x, 517 p. : $b ill. (some col.), digital ; $c 24 cm.
505 0 $a Part I: Beyond Lucky Electrons -- From Atoms to Circuits: Theoretical and Empirical Modeling of Hot Carrier Degradation -- The Energy Driven Hot Carrier Model -- Hot-Carrier Degradation in Decananometer -- Physics-based Modeling of Hot-carrier Degradation -- The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation -- Recovery from Hot Carrier Induced Degradation Through Temperature Treatment -- Characterization of MOSFET Interface States Using the Charge Pumping Technique -- Part II: CMOS and Beyond -- Channel Hot Carriers in SiGe and Ge pMOSFETs -- Channel Hot Carrier Degradation and Self-Heating Effects in FinFETs -- Characterization and Modeling of High-Voltage LDMOS Transistors -- Compact modelling of the Hot-carrier Degradation of Integrated HV MOSFETs -- Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors.
650 0 $a Hot carriers. $3 1063297
650 0 $a Semiconductors. $3 578843
650 1 4 $a Engineering. $3 561152
650 2 4 $a Circuits and Systems. $3 670901
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
700 1 $a Grasser, Tibor. $3 1021063
710 2 $a SpringerLink (Online service) $3 593884
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856 4 0 $u http://dx.doi.org/10.1007/978-3-319-08994-2
950 $a Engineering (Springer-11647)

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