Language:
English
繁體中文
Help
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
X-ray scattering from semiconductors...
~
Fewster, Paul F.
X-ray scattering from semiconductors and other materials
Record Type:
Language materials, printed : Monograph/item
Title/Author:
X-ray scattering from semiconductors and other materials/ Paul F. Fewster.
Author:
Fewster, Paul F.
Published:
New Jersey :World Scientific, : 2015.,
Description:
1 online resource (xvi, 493 p.) :ill. :
Subject:
X-rays - Scattering. -
Online resource:
http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc
ISBN:
9789814436939 (electronic bk.)
X-ray scattering from semiconductors and other materials
Fewster, Paul F.
X-ray scattering from semiconductors and other materials
[electronic resource] /Paul F. Fewster. - 3rd ed. - New Jersey :World Scientific,2015. - 1 online resource (xvi, 493 p.) :ill.
Includes bibliographical references (p. 475-476) and index.
An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
ISBN: 9789814436939 (electronic bk.)
LCCN: 2014031060Subjects--Topical Terms:
579905
X-rays
--Scattering.
LC Class. No.: QC482.S3 / F49 2015
Dewey Class. No.: 537.5/35
X-ray scattering from semiconductors and other materials
LDR
:01149cam a2200253 a 4500
001
857927
005
20150612131320.0
006
m o d
007
cr |n|---|||||
008
170421s2015 njua ob 001 0 eng c
010
$a
2014031060
020
$a
9789814436939 (electronic bk.)
020
$z
9789814436922 (hbk.)
035
$a
18337391
040
$a
OU/DLC
$b
eng
$c
OU
$d
DLC
050
0 0
$a
QC482.S3
$b
F49 2015
082
0 0
$a
537.5/35
$2
23
100
1
$a
Fewster, Paul F.
$3
1098781
245
1 0
$a
X-ray scattering from semiconductors and other materials
$h
[electronic resource] /
$c
Paul F. Fewster.
250
$a
3rd ed.
260
$a
New Jersey :
$b
World Scientific,
$c
2015.
300
$a
1 online resource (xvi, 493 p.) :
$b
ill.
504
$a
Includes bibliographical references (p. 475-476) and index.
505
0
$a
An introduction to semiconductor materials -- The theory of X-ray scattering -- Components for measuring scattering patterns -- Instruments for measuring scattering patterns -- A practical guide to the estimation of structural parameters and interpretation of scattering patterns.
588
$a
Description based on print version record.
650
0
$a
X-rays
$x
Scattering.
$3
579905
650
0
$a
Semiconductors.
$3
578843
856
4 0
$u
http://www.worldscientific.com/worldscibooks/10.1142/8648#t=toc
based on 0 review(s)
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login