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Transmission electron microscopy = d...
~
Carter, C. Barry.
Transmission electron microscopy = diffraction, imaging, and spectrometry /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Transmission electron microscopy/ edited by C. Barry Carter, David B. Williams.
Reminder of title:
diffraction, imaging, and spectrometry /
other author:
Carter, C. Barry.
Published:
Cham :Springer International Publishing : : 2016.,
Description:
xxxiii, 518 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Transmission electron microscopy. -
Online resource:
http://dx.doi.org/10.1007/978-3-319-26651-0
ISBN:
9783319266510
Transmission electron microscopy = diffraction, imaging, and spectrometry /
Transmission electron microscopy
diffraction, imaging, and spectrometry /[electronic resource] :edited by C. Barry Carter, David B. Williams. - Cham :Springer International Publishing :2016. - xxxiii, 518 p. :ill., digital ;24 cm.
Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
ISBN: 9783319266510
Standard No.: 10.1007/978-3-319-26651-0doiSubjects--Topical Terms:
677040
Transmission electron microscopy.
LC Class. No.: QH212.T7
Dewey Class. No.: 502.825
Transmission electron microscopy = diffraction, imaging, and spectrometry /
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diffraction, imaging, and spectrometry /
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Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
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Chemistry and Materials Science (Springer-11644)
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