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Low-power CMOS digital pixel imagers...
~
Margarit, Josep Maria.
Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications // Josep Maria Margarit.
Author:
Margarit, Josep Maria.
Published:
Cham, Switzerland :Springer, : 2017.,
Description:
xxi, 173 p. :ill. (some col.) ; : 24 cm.;
Notes:
"Doctoral thesis accepted by Universitat Politecnica de Cataluyna (UPC), Barcelona, Spain."
Subject:
Metal oxide semiconductors, Complementary. -
ISBN:
9783319499611 (cloth) :
Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications /
Margarit, Josep Maria.
Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications /
Josep Maria Margarit. - Cham, Switzerland :Springer,2017. - xxi, 173 p. :ill. (some col.) ;24 cm. - Springer theses. - Springer theses..
"Doctoral thesis accepted by Universitat Politecnica de Cataluyna (UPC), Barcelona, Spain."
Includes bibliographical references.
Introduction -- Frame-Based Smart IR Imagers -- Frame-Free Compact-Pitch IR Imagers -- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies -- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies -- Conclusions.
ISBN: 9783319499611 (cloth) :NT3587
Standard No.: 10.1007/978-3-319-49962-8doiSubjects--Topical Terms:
596746
Metal oxide semiconductors, Complementary.
LC Class. No.: TA1570
Dewey Class. No.: 621.36/72
Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications /
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Low-power CMOS digital pixel imagers for high-speed uncooled PbSe IR applications /
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Josep Maria Margarit.
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Cham, Switzerland :
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2017.
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xxi, 173 p. :
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ill. (some col.) ;
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24 cm.
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"Doctoral thesis accepted by Universitat Politecnica de Cataluyna (UPC), Barcelona, Spain."
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Includes bibliographical references.
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Introduction -- Frame-Based Smart IR Imagers -- Frame-Free Compact-Pitch IR Imagers -- Pixel Test Chips in 0.35mm and 0.15mm CMOS Technologies -- Imager Test Chips in 2.5mm, 0.35mm and 0.15mm CMOS Technologies -- Conclusions.
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Online resource; title from PDF title page (SpringerLink, viewed January 10, 2017).
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Metal oxide semiconductors, Complementary.
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