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Nanometer CMOS ICs = from basics to ...
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Veendrick, Harry J.M.
Nanometer CMOS ICs = from basics to ASICs /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
Nanometer CMOS ICs/ by Harry J.M. Veendrick.
Reminder of title:
from basics to ASICs /
Author:
Veendrick, Harry J.M.
Published:
Cham :Springer International Publishing : : 2017.,
Description:
xxxvii, 611 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Metal oxide semiconductors, Complementary. -
Online resource:
http://dx.doi.org/10.1007/978-3-319-47597-4
ISBN:
9783319475974
Nanometer CMOS ICs = from basics to ASICs /
Veendrick, Harry J.M.
Nanometer CMOS ICs
from basics to ASICs /[electronic resource] :by Harry J.M. Veendrick. - 2nd ed. - Cham :Springer International Publishing :2017. - xxxvii, 611 p. :ill. (some col.), digital ;24 cm.
Basic Principles -- Geometrical-, Physical- and Field-Scaling Impact on MOS Transistor Behavior -- Manufacture of MOS Devices -- CMOS Circuits -- Special Circuits, Devices and Technologies -- Memories -- Very Large Scale Integration (VLSI) and ASICs -- Low Power, a Hot Topic in IC Design -- Robustness of Nanometer CMOS Designs: Signal Integrity, Variability and Reliability -- Testing, Yield, Packaging, Debug and Failure Analysis -- Effects of Scaling on MOS IC Design and Consequences for the Roadmap.
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.
ISBN: 9783319475974
Standard No.: 10.1007/978-3-319-47597-4doiSubjects--Topical Terms:
596746
Metal oxide semiconductors, Complementary.
LC Class. No.: TK7871.99.M44
Dewey Class. No.: 621.38152
Nanometer CMOS ICs = from basics to ASICs /
LDR
:02454nam a2200325 a 4500
001
884758
003
DE-He213
005
20171103095127.0
006
m d
007
cr nn 008maaau
008
180530s2017 gw s 0 eng d
020
$a
9783319475974
$q
(electronic bk.)
020
$a
9783319475950
$q
(paper)
024
7
$a
10.1007/978-3-319-47597-4
$2
doi
035
$a
978-3-319-47597-4
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7871.99.M44
072
7
$a
TJFC
$2
bicssc
072
7
$a
TEC008010
$2
bisacsh
082
0 4
$a
621.38152
$2
23
090
$a
TK7871.99.M44
$b
V418 2017
100
1
$a
Veendrick, Harry J.M.
$3
1141434
245
1 0
$a
Nanometer CMOS ICs
$h
[electronic resource] :
$b
from basics to ASICs /
$c
by Harry J.M. Veendrick.
250
$a
2nd ed.
260
$a
Cham :
$c
2017.
$b
Springer International Publishing :
$b
Imprint: Springer,
300
$a
xxxvii, 611 p. :
$b
ill. (some col.), digital ;
$c
24 cm.
505
0
$a
Basic Principles -- Geometrical-, Physical- and Field-Scaling Impact on MOS Transistor Behavior -- Manufacture of MOS Devices -- CMOS Circuits -- Special Circuits, Devices and Technologies -- Memories -- Very Large Scale Integration (VLSI) and ASICs -- Low Power, a Hot Topic in IC Design -- Robustness of Nanometer CMOS Designs: Signal Integrity, Variability and Reliability -- Testing, Yield, Packaging, Debug and Failure Analysis -- Effects of Scaling on MOS IC Design and Consequences for the Roadmap.
520
$a
This textbook provides a comprehensive, fully-updated introduction to the essentials of nanometer CMOS integrated circuits. It includes aspects of scaling to even beyond 12nm CMOS technologies and designs. It clearly describes the fundamental CMOS operating principles and presents substantial insight into the various aspects of design implementation and application. Coverage includes all associated disciplines of nanometer CMOS ICs, including physics, lithography, technology, design, memories, VLSI, power consumption, variability, reliability and signal integrity, testing, yield, failure analysis, packaging, scaling trends and road blocks. The text is based upon in-house Philips, NXP Semiconductors, Applied Materials, ASML, IMEC, ST-Ericsson, TSMC, etc., courseware, which, to date, has been completed by more than 4500 engineers working in a large variety of related disciplines: architecture, design, test, fabrication process, packaging, failure analysis and software.
650
0
$a
Metal oxide semiconductors, Complementary.
$3
596746
650
0
$a
Application-specific integrated circuits.
$3
632555
650
1 4
$a
Engineering.
$3
561152
650
2 4
$a
Circuits and Systems.
$3
670901
650
2 4
$a
Electronic Circuits and Devices.
$3
782968
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
670219
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer eBooks
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-47597-4
950
$a
Engineering (Springer-11647)
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