Language:
English
繁體中文
Help
Login
Back
Switch To:
Labeled
|
MARC Mode
|
ISBD
3D microelectronic packaging = from ...
~
Goyal, Deepak.
3D microelectronic packaging = from fundamentals to applications /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
3D microelectronic packaging/ edited by Yan Li, Deepak Goyal.
Reminder of title:
from fundamentals to applications /
other author:
Li, Yan.
Published:
Cham :Springer International Publishing : : 2017.,
Description:
ix, 463 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
Subject:
Microelectronics - Packaging. -
Online resource:
http://dx.doi.org/10.1007/978-3-319-44586-1
ISBN:
9783319445861
3D microelectronic packaging = from fundamentals to applications /
3D microelectronic packaging
from fundamentals to applications /[electronic resource] :edited by Yan Li, Deepak Goyal. - Cham :Springer International Publishing :2017. - ix, 463 p. :ill., digital ;24 cm. - Springer series in advanced microelectronics,v.571437-0387 ;. - Springer series in advanced microelectronics ;33..
This volume provides a comprehensive reference for graduate students and professionals in both academia and industry on the fundamentals, processing details, and applications of 3D microelectronic packaging, an industry trend for future microelectronic packages. Chapters written by experts cover the most recent research results and industry progress in the following areas: TSV, die processing, micro bumps, direct bonding, thermal compression bonding, advanced materials, heat dissipation, thermal management, thermal mechanical modeling, quality, reliability, fault isolation, and failure analysis of 3D microelectronic packages. Numerous images, tables, and didactic schematics are included throughout. This essential volume equips readers with an in-depth understanding of all aspects of 3D packaging, including packaging architecture, processing, thermal mechanical and moisture related reliability concerns, common failures, developing areas, and future challenges, providing insights into key areas for future research and development. Provides comprehensive coverage of the state-of-the-art in 3D microelectronic packages Covers advanced materials and processes, quality and reliability concerns, and fault isolation and failure analysis Discusses 3D electronic package architecture and assembly process design Features contributions from both academic and industry authors, for a complete view of this important technology.
ISBN: 9783319445861
Standard No.: 10.1007/978-3-319-44586-1doiSubjects--Topical Terms:
1127490
Microelectronics
--Packaging.
LC Class. No.: TK7874
Dewey Class. No.: 621.381
3D microelectronic packaging = from fundamentals to applications /
LDR
:02475nam a2200325 a 4500
001
958374
003
DE-He213
005
20170809113114.0
006
m d
007
cr nn 008maaau
008
201118s2017 gw s 0 eng d
020
$a
9783319445861
$q
(electronic bk.)
020
$a
9783319445847
$q
(paper)
024
7
$a
10.1007/978-3-319-44586-1
$2
doi
035
$a
978-3-319-44586-1
040
$a
GP
$c
GP
041
0
$a
eng
050
4
$a
TK7874
072
7
$a
TJF
$2
bicssc
072
7
$a
TEC008000
$2
bisacsh
072
7
$a
TEC008070
$2
bisacsh
082
0 4
$a
621.381
$2
23
090
$a
TK7874
$b
.T531 2017
245
0 0
$a
3D microelectronic packaging
$h
[electronic resource] :
$b
from fundamentals to applications /
$c
edited by Yan Li, Deepak Goyal.
260
$a
Cham :
$c
2017.
$b
Springer International Publishing :
$b
Imprint: Springer,
300
$a
ix, 463 p. :
$b
ill., digital ;
$c
24 cm.
490
1
$a
Springer series in advanced microelectronics,
$x
1437-0387 ;
$v
v.57
520
$a
This volume provides a comprehensive reference for graduate students and professionals in both academia and industry on the fundamentals, processing details, and applications of 3D microelectronic packaging, an industry trend for future microelectronic packages. Chapters written by experts cover the most recent research results and industry progress in the following areas: TSV, die processing, micro bumps, direct bonding, thermal compression bonding, advanced materials, heat dissipation, thermal management, thermal mechanical modeling, quality, reliability, fault isolation, and failure analysis of 3D microelectronic packages. Numerous images, tables, and didactic schematics are included throughout. This essential volume equips readers with an in-depth understanding of all aspects of 3D packaging, including packaging architecture, processing, thermal mechanical and moisture related reliability concerns, common failures, developing areas, and future challenges, providing insights into key areas for future research and development. Provides comprehensive coverage of the state-of-the-art in 3D microelectronic packages Covers advanced materials and processes, quality and reliability concerns, and fault isolation and failure analysis Discusses 3D electronic package architecture and assembly process design Features contributions from both academic and industry authors, for a complete view of this important technology.
650
0
$a
Microelectronics
$x
Packaging.
$3
1127490
650
1 4
$a
Engineering.
$3
561152
650
2 4
$a
Electronics and Microelectronics, Instrumentation.
$3
670219
650
2 4
$a
Optical and Electronic Materials.
$3
593919
650
2 4
$a
Electronic Circuits and Devices.
$3
782968
650
2 4
$a
Microengineering.
$3
785695
650
2 4
$a
Nanotechnology and Microengineering.
$3
722030
650
2 4
$a
Metallic Materials.
$3
671028
700
1
$a
Li, Yan.
$3
1028637
700
1
$a
Goyal, Deepak.
$3
1250505
710
2
$a
SpringerLink (Online service)
$3
593884
773
0
$t
Springer eBooks
830
0
$a
Springer series in advanced microelectronics ;
$v
33.
$3
888202
856
4 0
$u
http://dx.doi.org/10.1007/978-3-319-44586-1
950
$a
Engineering (Springer-11647)
based on 0 review(s)
Multimedia
Reviews
Add a review
and share your thoughts with other readers
Export
pickup library
Processing
...
Change password
Login