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Pattern Recognition = 7th Chinese Conference, CCPR 2016, Chengdu, China, November 5-7, 2016, Proceedings, Part II /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Pattern Recognition/ edited by Tieniu Tan, Xuelong Li, Xilin Chen, Jie Zhou, Jian Yang, Hong Cheng.
Reminder of title:	7th Chinese Conference, CCPR 2016, Chengdu, China, November 5-7, 2016, Proceedings, Part II /
other author:	Tan, Tieniu.
Description:	XXIII, 735 p. 311 illus.online resource. :
Contained By:	Springer Nature eBook
Subject:	Pattern recognition. -
Online resource:	https://doi.org/10.1007/978-981-10-3005-5
ISBN:	9789811030055

Pattern Recognition = 7th Chinese Conference, CCPR 2016, Chengdu, China, November 5-7, 2016, Proceedings, Part II /
Pattern Recognition7th Chinese Conference, CCPR 2016, Chengdu, China, November 5-7, 2016, Proceedings, Part II /[electronic resource] :edited by Tieniu Tan, Xuelong Li, Xilin Chen, Jie Zhou, Jian Yang, Hong Cheng. - 1st ed. 2016. - XXIII, 735 p. 311 illus.online resource. - Communications in Computer and Information Science,6631865-0929 ;. - Communications in Computer and Information Science,498.

Robotics -- Computer vision -- Basic theory of pattern recognition -- Image and video processing -- Speech and language -- Emotion recognition.

The two-volume set CCIS 662 and CCIS 663 constitutes the refereed proceedings of the 7th Chinese Conference on Pattern Recognition, CCPR 2016, held in Chengdu, China, in November 2016. The 121 revised papers presented in two volumes were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections on robotics; computer vision; basic theory of pattern recognition; image and video processing; speech and language; emotion recognition.

ISBN: 9789811030055

Standard No.: 10.1007/978-981-10-3005-5doiSubjects--Topical Terms:

1253525
Pattern recognition.

LC Class. No.: Q337.5

Dewey Class. No.: 006.4

Pattern Recognition = 7th Chinese Conference, CCPR 2016, Chengdu, China, November 5-7, 2016, Proceedings, Part II /
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