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Progress in Nanoscale Characterization and Manipulation

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Progress in Nanoscale Characterization and Manipulation/ edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai.
other author:	Wang, Rongming.
Description:	VII, 508 p. 333 illus., 26 illus. in color.online resource. :
Contained By:	Springer Nature eBook
Subject:	Nanoscale science. -
Online resource:	https://doi.org/10.1007/978-981-13-0454-5
ISBN:	9789811304545

Progress in Nanoscale Characterization and Manipulation
Progress in Nanoscale Characterization and Manipulation[electronic resource] /edited by Rongming Wang, Chen Wang, Hongzhou Zhang, Jing Tao, Xuedong Bai. - 1st ed. 2018. - VII, 508 p. 333 illus., 26 illus. in color.online resource. - Springer Tracts in Modern Physics,2720081-3869 ;. - Springer Tracts in Modern Physics,260.

Electron/Ion Optics -- Scanning Electron Microscopy -- Transmission Electron Microscopy -- Scanning Transmission Electron Microscopy (STEM) -- Spectroscopy -- Aberration Corrected Transmission Electron Microscopy and Its Applications -- In situ TEM: Theory and Applications -- Helium Ion Microscopy.

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

ISBN: 9789811304545

Standard No.: 10.1007/978-981-13-0454-5doiSubjects--Topical Terms:

1253587
Nanoscale science.

LC Class. No.: QC176.8.N35

Dewey Class. No.: 620.5

Progress in Nanoscale Characterization and Manipulation
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