懸臂式探針卡.

應用基因演算法於晶圓測試用細間距多層探針幾何結構之優化設計研究 = = Optimization Design of Fine-Pitch Multi-Layer Probe Geometry for Wafer Testing Using Genetic Algorithm / by: (Language materials, printed)

Cantilever Probe Card.

Contact Resistance.

Multi-Objective Genetic Algorithm.

多目標基遺傳因演算法.

懸臂式探針卡.

接觸電阻.