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概要
書目資訊
主題
Integrated circuits - Very large scale integration - Testing.
概要
作品:
3 作品在 1 項出版品 1 種語言
書目資訊
System-on-chip test architectures = nanometer design for testability /
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(書目-語言資料,印刷品)
VLSI test principles and architectures = design for testability /
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(書目-語言資料,印刷品)
Debug automation from pre-silicon to post-silicon
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(書目-語言資料,印刷品)
主題
Integrated circuits
Circuits and Systems.
Systems on a chip
Electronic Circuits and Devices.
Engineering.
Processor Architectures.
處理中
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