語系:
繁體中文
English
說明(常見問題)
登入
跳至 :
概要
書目資訊
主題
Integrated circuits - Testing.
概要
作品:
5 作品在 3 項出版品 3 種語言
書目資訊
Counterfeit integrated circuits = detection and avoidance /
by:
(書目-語言資料,印刷品)
Nanometer technology designs = high-quality delay tests /
by:
(書目-語言資料,印刷品)
Integrated circuit manufacturability = the art of process and design integration /
by:
(書目-語言資料,印刷品)
High quality test pattern generation and boolean satisfiability
by:
(書目-語言資料,印刷品)
An engineer's guide to automated testing of high-speed interfaces /
by:
(書目-語言資料,印刷品)
主題
Electronics and Microelectronics, Instrumentation.
Integrated circuits
Circuits and Systems.
Product counterfeiting.
Very high speed integrated circuits.
Algebra, Boolean.
Nanoelectronics.
Nanotechnology.
Electronic Circuits and Devices.
Electrical Engineering.
Engineering.
Automatic test equipment.
Computer-Aided Engineering (CAD, CAE) and Design.
Metal oxide semiconductors, Complementary
Processor Architectures.
處理中
...
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入