語系:
繁體中文
English
說明(常見問題)
登入
跳至 :
概要
書目資訊
主題
Integrated circuits - Ultra large scale integration.
概要
作品:
4 作品在 1 項出版品 1 種語言
書目資訊
Applications of finite element methods for reliability studies on ULSI interconnections
by:
(書目-語言資料,印刷品)
Advanced nanoscale ULSI interconnects = fundamentals and applications /
by:
(書目-語言資料,印刷品)
Advanced interconnects for ULSI technology
by:
(書目-語言資料,印刷品)
ULSI front-end technology = covering from the first semiconductor paper to CMOS FINFET technology /
by:
(書目-語言資料,印刷品)
主題
Electronics and Microelectronics, Instrumentation.
Industrial Chemistry/Chemical Engineering.
Electrochemistry.
Integrated circuits
Electronic books.
TECHNOLOGY & ENGINEERING / Electronics / Circuits / Logic
Metal oxide semiconductors, Complementary.
Nanoelectromechanical systems.
Quality Control, Reliability, Safety and Risk.
Nanotechnology.
Chemistry.
Partial Differential Equations.
Semiconductors
Electrical Engineering.
Materials Science, general.
Optical and Electronic Materials.
Computational Intelligence.
TECHNOLOGY & ENGINEERING / Electronics / Circuits / VLSI & ULSI.
Engineering.
Reliability (Engineering)
COMPUTERS / Logic Design
Finite element method.
Interconnects (Integrated circuit technology)
處理中
...
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入