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Essentials of electronic testing for...

Agrawal, Vishwani D (1943)

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

紀錄類型:	書目-語言資料,印刷品 : 單行本
作者:	BushnellMichael L,
其他作者:	AgrawalVishwani D, 1943
出版地:	Boston, MA
出版者:	Kluwer Academic;
出版年:	2000
面頁冊數:	xviii, 690 pill : 25 cm;
集叢名:	Frontiers in electronic testing
標題:	Integrated circuits - Very large scale integration -
標題:	Digital integrated circuits - Testing -
標題:	Mixed signal circuits - Testing -
標題:	Semiconductor storage devices - Testing -
ISBN:	0792379918

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Bushnell, Michael L

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal - Boston, MA : Kluwer Academic, 2000. - xviii, 690 p ; ill ; 25 cm. - (Frontiers in electronic testing).
Includes bibliographical references (p. [631]-670) and index.
ISBN 0792379918
Integrated circuitsDigital integrated circuitsMixed signal circuitsSemiconductor storage devices -- Very large scale integration -- Testing -- Testing -- Testing

Agrawal, Vishwani D

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
LDR:00730cam 2200193 i 450 001 459673
005 20101024003935.0
009 att 00000186
010 1 $ b(hbk.) $a 0792379918 $d NT
100 $a 20080130d2000 m y0engy01 b
101 0 $a eng
200 1 $a Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits $f Michael L. Bushnell, Vishwani D. Agrawal
210 $a Boston, MA $c Kluwer Academic $d 2000
215 0 $a xviii, 690 p $c ill $d 25 cm
225 2 $a Frontiers in electronic testing
320 $a Includes bibliographical references (p. [631]-670) and index
410 0 $1 2001 $a Frontiers in electronic testing
606 $a Integrated circuits $x Very large scale integration $3 392457 $2 lc $3 725736
606 $a Digital integrated circuits $x Testing $3 445230 $2 lc $3 734275
606 $a Mixed signal circuits $x Testing $3 445231 $2 lc $3 734276
606 $a Semiconductor storage devices $x Testing $3 445232 $2 lc $3 734277
676 $a 621.39/5 $v 21
680 $a TK7874.75 $b B87 2000
700 $a Bushnell $b Michael L $3 445228
702 $a Agrawal $b Vishwani D $f 1943 $3 445229
801 1 $a cw $b 國立虎尾科技大學圖書館圖書館 $c 20020515