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Essentials of electronic testing for...
~
Agrawal, Vishwani D (1943)
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Record Type:
Language materials, printed : monographic
Author:
BushnellMichael L,
Secondary Intellectual Responsibility:
AgrawalVishwani D, 1943
Place of Publication:
Boston, MA
Published:
Kluwer Academic;
Year of Publication:
2000
Description:
xviii, 690 pill : 25 cm;
Series:
Frontiers in electronic testing
Subject:
Integrated circuits - Very large scale integration -
Subject:
Digital integrated circuits - Testing -
Subject:
Mixed signal circuits - Testing -
Subject:
Semiconductor storage devices - Testing -
ISBN:
0792379918
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Bushnell, Michael L
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
/ Michael L. Bushnell, Vishwani D. Agrawal - Boston, MA : Kluwer Academic, 2000. - xviii, 690 p ; ill ; 25 cm. - (Frontiers in electronic testing).
Includes bibliographical references (p. [631]-670) and index.
ISBN 0792379918
Integrated circuitsDigital integrated circuitsMixed signal circuitsSemiconductor storage devices -- Very large scale integration -- Testing -- Testing -- Testing
Agrawal, Vishwani D
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
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Michael L. Bushnell, Vishwani D. Agrawal
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Boston, MA
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Includes bibliographical references (p. [631]-670) and index
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國立虎尾科技大學圖書館圖書館
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20020515
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E022279
圖書館3F 書庫
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621.395 B979 2000
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