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Atomic force microscopy/scanning tun...

U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium (1994)

Atomic force microscopy/scanning tunneling microscopy 2

Record Type:	Language materials, printed : monographic
Secondary Intellectual Responsibility:	CohenSamuel H,
Secondary Intellectual Responsibility:	LightbodyMarcia L,
Corporate Body:	U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium1994
Place of Publication:	New York
Published:	Plenum Press; Plenum Press;
Year of Publication:	c1997
Description:	ix, 250 pill : 26 cm;
Subject:	Atomic force microscopy -
Subject:	Scanning tunneling microscopy -
Notes:	"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso
ISBN:	030645596X

Atomic force microscopy/scanning tunneling microscopy 2
U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium

Atomic force microscopy/scanning tunneling microscopy 2 / edited by Samuel H. Cohen and Marcia L. Lightbody - New York : Plenum Press, c1997. - ix, 250 p ; ill ; 26 cm.
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
Includes bibliographical references and index.
ISBN 030645596X
Atomic force microscopyScanning tunneling microscopy

Cohen, Samuel H

Atomic force microscopy/scanning tunneling microscopy 2
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