國立虎尾科技大學 |

登入

回首頁

Atomic force microscopy/scanning tun...

U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium (1994)

Atomic force microscopy/scanning tunneling microscopy 2

紀錄類型:	書目-語言資料,印刷品 : 單行本
其他作者:	CohenSamuel H,
其他作者:	LightbodyMarcia L,
團體作者:	U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium1994
出版地:	New York
出版者:	Plenum Press; Plenum Press;
出版年:	c1997
面頁冊數:	ix, 250 pill : 26 cm;
標題:	Atomic force microscopy -
標題:	Scanning tunneling microscopy -
附註:	"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso
ISBN:	030645596X

Atomic force microscopy/scanning tunneling microscopy 2
U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium

Atomic force microscopy/scanning tunneling microscopy 2 / edited by Samuel H. Cohen and Marcia L. Lightbody - New York : Plenum Press, c1997. - ix, 250 p ; ill ; 26 cm.
"Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso.
Includes bibliographical references and index.
ISBN 030645596X
Atomic force microscopyScanning tunneling microscopy

Cohen, Samuel H

Atomic force microscopy/scanning tunneling microscopy 2
LDR:00905cam 2200193 i 450 001 460218
009 ahw 00000062
010 1 $4 187 $a 030645596X $d NT
100 $a 20070327f 1997m y0engy01 b
101 0 $a eng
200 1 $a Atomic force microscopy/scanning tunneling microscopy 2 $f edited by Samuel H. Cohen and Marcia L. Lightbody
210 $a New York $c Plenum Press $d c1997 $c Plenum Press
215 0 $a ix, 250 p $c ill $d 26 cm
300 $a "Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--T.p. verso
320 $a Includes bibliographical references and index
606 $2 lc $a Atomic force microscopy $3 446075
606 $2 lc $a Scanning tunneling microscopy $3 397819
676 $a 502/.8/2 $v 21
680 $a QH212.A78 $b A863 1997
702 $a Cohen $b Samuel H $3 446072
702 $a Lightbody $b Marcia L $3 446073
710 $a U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium $e Natick, Mass.) $d (2nd $f 1994 $3 446074
801 0 $b DLC
801 0 $a cw $b BIB $c 20030409
801 1 $a cw $b 國立虎尾科技大學圖書館圖書館 $c 20030409