Plenum Press

書目資訊

Advances in x-ray analysis : proceed...
Denver Research Institute
Semiconductor Device Physics and Sim...
Liou, Juin J
Atomic force microscopy/scanning tun...
Lightbody, Marcia L
Science and technology of polymers a...
International Conference on Frontiers of Polymers and Advanced Materials (1997)
by: International Conference on Frontiers of Polymers and Advanced Materials (1997)
Perspective in powder metallurgy
Johnson, Peter K
Optoelectronic properties of inorgan...
Fackler, John P
Beam effects, surface topography, an...
Madey, Theodore E
Functional and smart materials : str...
Wang, Zhong Lin
Transmission electron microscopy : a...
Williams, David B
Fundamentals of laser optics
Iga, Kenichi
X-Ray diffraction : a practical approach
Norton, M. Grant
Reliability evaluation of power systems
Allan, Ronald N
Fluorescence microscopy and fluoresc...
Conference on Fluorescence Microscopy and Fluorescent Probes
by: Conference on Fluorescence Microscopy and Fluorescent Probes
Army Materials technology conference
Burke, John J
Principles of quantum mechanics
Shankar, Ramamurti
by: Shankar, Ramamurti
 
 
變更密碼[密碼必須為2種組合(英文和數字)及長度為10碼以上]
登入