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Beam effects, surface topography, an...

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Czanderna, Alvin Warren (1930)

Beam effects, surface topography, and depth profiling in surface analysis

紀錄類型:	書目-語言資料,印刷品 : 單行本
其他作者:	CzandernaAlvin Warren, 1930
其他作者:	MadeyTheodore E,
其他作者:	PowellC. J,
出版地:	New York
出版者:	Plenum Press;
出版年:	c1998
面頁冊數:	xix, 430 pill : 24 cm;
集叢名:	Methods of surface characerization
標題:	Surfaces (Technology) - Analysis -
標題:	Materials - Effect of radiation on -
ISBN:	0306458969

Beam effects, surface topography, and depth profiling in surface analysis
Beam effects, surface topography, and depth profiling in surface analysis / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell - New York : Plenum Press, c1998. - xix, 430 p ; ill ; 24 cm. - (Methods of surface characerization ; v. 5).
Includes bibliographical references and index.
ISBN 0306458969
Surfaces (Technology)Materials -- Analysis -- Effect of radiation on

Czanderna, Alvin Warren

Beam effects, surface topography, and depth profiling in surface analysis
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210 $a New York $c Plenum Press $d c1998
215 0 $a xix, 430 p $c ill $d 24 cm
225 2 $a Methods of surface characerization $v v. 5
320 $a Includes bibliographical references and index
410 0 $1 2001 $a ;v. 5 $a Methods of surface characerization
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606 $a Materials $x Effect of radiation on $3 434175 $2 lc $3 734252
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702 $a Madey $b Theodore E $3 447856
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E022644

圖書館3F 書庫

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一般圖書

620.44 B366 1998

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