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應用像散法與斯涅爾定律量測透明基板厚度與折射率 = Applicatio...

Chien-hung Liu

應用像散法與斯涅爾定律量測透明基板厚度與折射率 = Application of astigmatic method and snell's law on the thickness and refractive index measurement of transparent plate

Record Type:	Language materials, printed : monographic
Paralel Title:	Application of astigmatic method and snell's law on the thickness and refractive index measurement of transparent plate
Author:	黃偉銓,
Secondary Intellectual Responsibility:	劉建宏,
Place of Publication:	雲林縣
Published:	國立虎尾科技大學;
Year of Publication:	民98[2009]
Edition:	初版
Description:	86面圖 : 30公分;
Subject:	DVD讀取頭
Subject:	像散法
Subject:	半導體雷射
Subject:	厚度
Subject:	取頭
Subject:	折射率
Subject:	Astigmatic Method
Subject:	DVD Pickup Heads
Subject:	Refractive Index
Subject:	Semiconductor Laser
Subject:	Thickness
Online resource:	http://cetd.lib.nfu.edu.tw/etdservice/view_metadata?etdun=U0028-3007200922440000

應用像散法與斯涅爾定律量測透明基板厚度與折射率 = Application of astigmatic method and snell's law on the thickness and refractive index measurement of transparent plate
黃, 偉銓

應用像散法與斯涅爾定律量測透明基板厚度與折射率 = Application of astigmatic method and snell's law on the thickness and refractive index measurement of transparent plate / 黃偉銓撰 - 初版. - 雲林縣 : 國立虎尾科技大學, 民98[2009]. - 86面 ; 圖 ; 30公分.
含參考書目.
DVD讀取頭像散法半導體雷射厚度取頭折射率Astigmatic MethodDVD Pickup HeadsRefractive IndexSemiconductor LaserThickness

劉, 建宏

應用像散法與斯涅爾定律量測透明基板厚度與折射率 = Application of astigmatic method and snell's law on the thickness and refractive index measurement of transparent plate
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