Grasser, Tibor.

Overview

Works:	1 works in 2 publications in 1 languages

Titles

Noise in Nanoscale Semiconductor Devices by: Grasser, Tibor.; SpringerLink (Online service) (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]

Hot Carrier Degradation in Semiconductor Devices by: SpringerLink (Online service); Grasser, Tibor. (Language materials, printed) , [http://id.loc.gov/vocabulary/relators/edt]

Hot carrier degradation in semiconductor devices by: Grasser, Tibor.; SpringerLink (Online service) (Language materials, printed)

Bias temperature instability for devices and circuits by: SpringerLink (Online service); Grasser, Tibor. (Language materials, printed)

Subjects

Electronics and Microelectronics, Instrumentation. Microelectronics. Circuits and Systems. Electronic circuits. Electronics. Hot carriers. Quality Control, Reliability, Safety and Risk. Metal oxide semiconductor field-effect transistors. Electronic Circuits and Devices. Semiconductors. Engineering.