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Noise in Nanoscale Semiconductor Devices

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Noise in Nanoscale Semiconductor Devices

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Noise in Nanoscale Semiconductor Devices/ edited by Tibor Grasser.
其他作者:	Grasser, Tibor.
面頁冊數:	VI, 729 p. 550 illus., 443 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Electronics and Microelectronics, Instrumentation. -
電子資源:	https://doi.org/10.1007/978-3-030-37500-3
ISBN:	9783030375003

Noise in Nanoscale Semiconductor Devices
Noise in Nanoscale Semiconductor Devices[electronic resource] /edited by Tibor Grasser. - 1st ed. 2020. - VI, 729 p. 550 illus., 443 illus. in color.online resource.

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.

ISBN: 9783030375003

Standard No.: 10.1007/978-3-030-37500-3doiSubjects--Topical Terms:

670219
Electronics and Microelectronics, Instrumentation.

LC Class. No.: TK7888.4

Dewey Class. No.: 621.3815

Noise in Nanoscale Semiconductor Devices
LDR:02100nam a22003855i 4500 001 1022487
003 DE-He213
005 20200630085713.0
007 cr nn 008mamaa
008 210318s2020 gw | s |||| 0|eng d
020 $a 9783030375003 $9 978-3-030-37500-3
024 7 $a 10.1007/978-3-030-37500-3 $2 doi
035 $a 978-3-030-37500-3
050 4 $a TK7888.4
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
072 7 $a TJFC $2 thema
082 0 4 $a 621.3815 $2 23
245 1 0 $a Noise in Nanoscale Semiconductor Devices $h [electronic resource] / $c edited by Tibor Grasser.
250 $a 1st ed. 2020.
264 1 $a Cham : $b Springer International Publishing : $b Imprint: Springer, $c 2020.
300 $a VI, 729 p. 550 illus., 443 illus. in color. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
520 $a This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
650 2 4 $a Electronic Circuits and Devices. $3 782968
650 1 4 $a Circuits and Systems. $3 670901
650 0 $a Microelectronics. $3 554956
650 0 $a Electronics. $3 596389
650 0 $a Electronic circuits. $3 563332
700 1 $a Grasser, Tibor. $4 edt $4 http://id.loc.gov/vocabulary/relators/edt $3 1021063
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9783030374990
776 0 8 $i Printed edition: $z 9783030375010
776 0 8 $i Printed edition: $z 9783030375027
856 4 0 $u https://doi.org/10.1007/978-3-030-37500-3
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)

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