Languages
Celano, Umberto.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Metrology and Physical Mechanisms in New Generation Ionic Devices
by:
Celano, Umberto.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/aut]
Metrology and physical mechanisms in new generation ionic devices
by:
SpringerLink (Online service); Celano, Umberto.
(Language materials, printed)
Electrical atomic force microscopy for nanoelectronics
by:
Celano, Umberto.; SpringerLink (Online service)
(Language materials, printed)
Electrical Atomic Force Microscopy for Nanoelectronics
by:
Celano, Umberto.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Subjects
Thin films.
Nanotechnology and Microengineering.
Electronics and Microelectronics, Instrumentation.
Microelectronics.
Optical materials.
Microscopy.
Spectroscopy.
Atomic force microscopy.
Nanostructures.
Nanoscale Science and Technology.
Electronics.
Nanoscience.
Nanoelectronics.
Electronic apparatus and appliances.
Characterization and Evaluation of Materials.
Nanotechnology.
Nonvolatile random-access memory.
Optical and Electronic Materials.
Spectroscopy and Microscopy.
Materials science.
Physics.
Nanoscale science.
Electronic materials.
Metrology.