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Metrology and physical mechanisms in...

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Metrology and physical mechanisms in new generation ionic devices

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Metrology and physical mechanisms in new generation ionic devices/ by Umberto Celano.
作者:	Celano, Umberto.
出版者:	Cham :Springer International Publishing : : 2016.,
面頁冊數:	xxiv, 175 p. :ill. (some col.), digital ; : 24 cm.;
Contained By:	Springer eBooks
標題:	Thin films. -
電子資源:	http://dx.doi.org/10.1007/978-3-319-39531-9
ISBN:	9783319395319

Metrology and physical mechanisms in new generation ionic devices
Celano, Umberto.

Metrology and physical mechanisms in new generation ionic devices[electronic resource] /by Umberto Celano. - Cham :Springer International Publishing :2016. - xxiv, 175 p. :ill. (some col.), digital ;24 cm. - Springer theses,2190-5053. - Springer theses..

Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.

ISBN: 9783319395319

Standard No.: 10.1007/978-3-319-39531-9doiSubjects--Topical Terms:

560219
Thin films.

LC Class. No.: QC176.83

Dewey Class. No.: 621.38152

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