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Metrology and Physical Mechanisms in New Generation Ionic Devices

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	Metrology and Physical Mechanisms in New Generation Ionic Devices/ by Umberto Celano.
作者:	Celano, Umberto.
面頁冊數:	XXIV, 175 p. 96 illus., 18 illus. in color.online resource. :
Contained By:	Springer Nature eBook
標題:	Spectroscopy. -
電子資源:	https://doi.org/10.1007/978-3-319-39531-9
ISBN:	9783319395319

Metrology and Physical Mechanisms in New Generation Ionic Devices
Celano, Umberto.

Metrology and Physical Mechanisms in New Generation Ionic Devices[electronic resource] /by Umberto Celano. - 1st ed. 2016. - XXIV, 175 p. 96 illus., 18 illus. in color.online resource. - Springer Theses, Recognizing Outstanding Ph.D. Research,2190-5053. - Springer Theses, Recognizing Outstanding Ph.D. Research,.

Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook. .

The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .

ISBN: 9783319395319

Standard No.: 10.1007/978-3-319-39531-9doiSubjects--Topical Terms:

1102161
Spectroscopy.

LC Class. No.: QC450-467

Dewey Class. No.: 621.36

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