語系
Celano, Umberto.
概要
| 作品: | 1 作品在 2 項出版品 1 種語言 | |
|---|---|---|
書目資訊
Metrology and Physical Mechanisms in New Generation Ionic Devices
by:
Celano, Umberto.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/aut]
Metrology and physical mechanisms in new generation ionic devices
by:
SpringerLink (Online service); Celano, Umberto.
(書目-語言資料,印刷品)
Electrical atomic force microscopy for nanoelectronics
by:
Celano, Umberto.; SpringerLink (Online service)
(書目-語言資料,印刷品)
Electrical Atomic Force Microscopy for Nanoelectronics
by:
Celano, Umberto.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
主題
Thin films.
Nanotechnology and Microengineering.
Electronics and Microelectronics, Instrumentation.
Microelectronics.
Optical materials.
Microscopy.
Spectroscopy.
Atomic force microscopy.
Nanostructures.
Nanoscale Science and Technology.
Electronics.
Nanoscience.
Nanoelectronics.
Electronic apparatus and appliances.
Characterization and Evaluation of Materials.
Nanotechnology.
Nonvolatile random-access memory.
Optical and Electronic Materials.
Spectroscopy and Microscopy.
Materials science.
Physics.
Nanoscale science.
Electronic materials.
Metrology.