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Escalante, Hugo Jair.

概要
作品: 1 作品在 2 項出版品 1 種語言
書目資訊
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part III / by: Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Del Bimbo, Alberto.; Farinella, Giovanni Maria.; Mei, Tao. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VIII / by: SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Del Bimbo, Alberto.; Farinella, Giovanni Maria.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.; Mei, Tao. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VII / by: Mei, Tao.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.; Del Bimbo, Alberto. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Advances in Artificial Intelligence - IBERAMIA 2016 = 15th Ibero-American Conference on AI, San José, Costa Rica, November 23-25, 2016, Proceedings / by: Murillo, Juan de Dios.; SpringerLink (Online service); Escalante, Hugo Jair.; Montes y Gómez, Manuel.; Segura, Alberto. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part I / by: Mei, Tao.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.; Del Bimbo, Alberto.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part II / by: Mei, Tao.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; Del Bimbo, Alberto.; SpringerLink (Online service); Sclaroff, Stan. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Explainable and Interpretable Models in Computer Vision and Machine Learning by: Baró, Xavier.; Güçlü, Umut.; Guyon, Isabelle.; Güçlütürk, Yağmur.; Escalera, Sergio.; Escalante, Hugo Jair.; van Gerven, Marcel.; SpringerLink (Online service) (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part IV / by: Mei, Tao.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; Del Bimbo, Alberto.; SpringerLink (Online service); Sclaroff, Stan. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
Explainable and interpretable models in computer vision and machine learning by: SpringerLink (Online service); Escalante, Hugo Jair. (書目-語言資料,印刷品)
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part VI / by: Mei, Tao.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; Del Bimbo, Alberto.; SpringerLink (Online service); Sclaroff, Stan. (書目-語言資料,印刷品) , [http://id.loc.gov/vocabulary/relators/edt]
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