Sclaroff, Stan.
Overview
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Titles
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part III /
by:
Del Bimbo, Alberto.; Mei, Tao.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VIII /
by:
Del Bimbo, Alberto.; Mei, Tao.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VII /
by:
Mei, Tao.; Del Bimbo, Alberto.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part II /
by:
Distante, Cosimo.; Leo, Marco.; Farinella, Giovanni M.; Tombari, Federico.; SpringerLink (Online service); Sclaroff, Stan.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part I /
by:
Mei, Tao.; Del Bimbo, Alberto.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part III /
by:
Leo, Marco.; Distante, Cosimo.; Farinella, Giovanni M.; Sclaroff, Stan.; Tombari, Federico.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part II /
by:
Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part IV /
by:
Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part I /
by:
Mazzeo, Pier Luigi.; Distante, Cosimo.; SpringerLink (Online service); Sclaroff, Stan.; Frontoni, Emanuele.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part I /
by:
SpringerLink (Online service); Tombari, Federico.; Sclaroff, Stan.; Farinella, Giovanni M.; Leo, Marco.; Distante, Cosimo.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part II /
by:
Distante, Cosimo.; Mazzeo, Pier Luigi.; Frontoni, Emanuele.; Sclaroff, Stan.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Visual Saliency: From Pixel-Level to Object-Level Analysis
by:
Malmberg, Filip.; Zhang, Jianming.; Sclaroff, Stan.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/aut]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part VI /
by:
Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.; Mei, Tao.; Del Bimbo, Alberto.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part V /
by:
Mei, Tao.; Del Bimbo, Alberto.; SpringerLink (Online service); Sclaroff, Stan.; Farinella, Giovanni Maria.; Cucchiara, Rita.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
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Subjects
Computer science—Mathematics.
Computer Application in Social and Behavioral Sciences.
Computer engineering.
Pattern recognition systems.
Image Processing and Computer Vision.
Signal, Image and Speech Processing.
Artificial intelligence.
Automated Pattern Recognition.
Computer Communication Networks.
Computers and Education.
Signal processing.
Machine learning.
Education—Data processing.
Information Systems Applications (incl. Internet).
Mathematics of Computing.
Image Processing.
Computer Vision.
Speech processing systems.
Computer vision.
Computer and Information Systems Applications.
Computer Engineering and Networks.
Computer communication systems.
Application software.
Artificial Intelligence.
Data mining.
Social sciences—Data processing.
Machine Learning.
Computing Milieux.
Optical data processing.
Computers.
Image processing.
Computer Imaging, Vision, Pattern Recognition and Graphics.
Image processing—Digital techniques.
Data Mining and Knowledge Discovery.
Computer networks .