書封
Sclaroff, Stan.
概要
| 作品: | 1 作品在 0 項出版品 0 種語言 | |
|---|---|---|
書目資訊
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part III /
by:
Del Bimbo, Alberto.; Mei, Tao.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VIII /
by:
Del Bimbo, Alberto.; Mei, Tao.; SpringerLink (Online service); Sclaroff, Stan.; Cucchiara, Rita.; Farinella, Giovanni Maria.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10-15, 2021, Proceedings, Part VII /
by:
Mei, Tao.; Del Bimbo, Alberto.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part II /
by:
Distante, Cosimo.; Leo, Marco.; Farinella, Giovanni M.; Tombari, Federico.; SpringerLink (Online service); Sclaroff, Stan.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part I /
by:
Mei, Tao.; Del Bimbo, Alberto.; Sclaroff, Stan.; SpringerLink (Online service); Farinella, Giovanni Maria.; Cucchiara, Rita.; Escalante, Hugo Jair.; Vezzani, Roberto.; Bertini, Marco.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part III /
by:
Leo, Marco.; Distante, Cosimo.; Farinella, Giovanni M.; Sclaroff, Stan.; Tombari, Federico.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part II /
by:
Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part IV /
by:
Mei, Tao.; Del Bimbo, Alberto.; Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part I /
by:
Mazzeo, Pier Luigi.; Distante, Cosimo.; SpringerLink (Online service); Sclaroff, Stan.; Frontoni, Emanuele.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing – ICIAP 2022 = 21st International Conference, Lecce, Italy, May 23–27, 2022, Proceedings, Part I /
by:
SpringerLink (Online service); Tombari, Federico.; Sclaroff, Stan.; Farinella, Giovanni M.; Leo, Marco.; Distante, Cosimo.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Image Analysis and Processing. ICIAP 2022 Workshops = ICIAP International Workshops, Lecce, Italy, May 23–27, 2022, Revised Selected Papers, Part II /
by:
Distante, Cosimo.; Mazzeo, Pier Luigi.; Frontoni, Emanuele.; Sclaroff, Stan.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Visual Saliency: From Pixel-Level to Object-Level Analysis
by:
Malmberg, Filip.; Zhang, Jianming.; Sclaroff, Stan.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/aut]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part VI /
by:
Bertini, Marco.; Vezzani, Roberto.; Escalante, Hugo Jair.; Farinella, Giovanni Maria.; Cucchiara, Rita.; SpringerLink (Online service); Sclaroff, Stan.; Mei, Tao.; Del Bimbo, Alberto.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
Pattern Recognition. ICPR International Workshops and Challenges = Virtual Event, January 10–15, 2021, Proceedings, Part V /
by:
Mei, Tao.; Del Bimbo, Alberto.; SpringerLink (Online service); Sclaroff, Stan.; Farinella, Giovanni Maria.; Cucchiara, Rita.; Vezzani, Roberto.; Escalante, Hugo Jair.; Bertini, Marco.
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
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主題
Image Processing and Computer Vision.
Artificial intelligence.
Computer Communication Networks.
Signal processing.
Machine learning.
Computer and Information Systems Applications.
Application software.
Computers.
Computer networks .
Signal, Image and Speech Processing.
Automated Pattern Recognition.
Information Systems Applications (incl. Internet).
Mathematics of Computing.
Image Processing.
Computer Vision.
Computer vision.
Computer communication systems.
Computing Milieux.
Computer Imaging, Vision, Pattern Recognition and Graphics.
Computer science—Mathematics.
Computer Application in Social and Behavioral Sciences.
Computer engineering.
Pattern recognition systems.
Computers and Education.
Education—Data processing.
Speech processing systems.
Artificial Intelligence.
Social sciences—Data processing.
Image processing.
Image processing—Digital techniques.
Computer Engineering and Networks.
Data mining.
Machine Learning.
Optical data processing.
Data Mining and Knowledge Discovery.