Languages
Ketchen, Mark B.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Microelectronic test structures for CMOS technology
by:
Ketchen, Mark B.; SpringerLink (Online service); Bhushan, Manjul.
(Language materials, printed)
CMOS test and evaluation = a physical perspective /
by:
Ketchen, Mark B.; Bhushan, Manjul.; SpringerLink (Online service)
(Language materials, printed)
CMOS Test and Evaluation = A Physical Perspective /
by:
Ketchen, Mark B.; SpringerLink (Online service); Bhushan, Manjul.
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/aut]
Subjects
Electronics and Microelectronics, Instrumentation.
Microelectronics.
Circuits and Systems.
Systems engineering.
Electronics.
Electronic circuits.
Quality Control, Reliability, Safety and Risk.
Reliability.
Optical and Electronic Materials.
System safety.
Semiconductors.
Engineering.
Quality control.
Industrial safety.
Metal oxide semiconductors, Complementary