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CMOS Test and Evaluation = A Physical Perspective /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	CMOS Test and Evaluation/ by Manjul Bhushan, Mark B. Ketchen.
Reminder of title:	A Physical Perspective /
Author:	Bhushan, Manjul.
other author:	Ketchen, Mark B.
Description:	XIII, 424 p. 338 illus.online resource. :
Contained By:	Springer Nature eBook
Subject:	Reliability. -
Online resource:	https://doi.org/10.1007/978-1-4939-1349-7
ISBN:	9781493913497

CMOS Test and Evaluation = A Physical Perspective /
Bhushan, Manjul.

CMOS Test and EvaluationA Physical Perspective /[electronic resource] :by Manjul Bhushan, Mark B. Ketchen. - 1st ed. 2015. - XIII, 424 p. 338 illus.online resource.

Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.

This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.

ISBN: 9781493913497

Standard No.: 10.1007/978-1-4939-1349-7doiSubjects--Topical Terms:

573603
Reliability.

LC Class. No.: TK7800-8360

Dewey Class. No.: 621.381

CMOS Test and Evaluation = A Physical Perspective /
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505 0 $a Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
520 $a This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
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