國立虎尾科技大學 |

CMOS Test and Evaluation = A Physical Perspective /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
正題名/作者:	CMOS Test and Evaluation/ by Manjul Bhushan, Mark B. Ketchen.
其他題名:	A Physical Perspective /
作者:	Bhushan, Manjul.
其他作者:	Ketchen, Mark B.
面頁冊數:	XIII, 424 p. 338 illus.online resource. :
Contained By:	Springer Nature eBook
標題:	Reliability. -
電子資源:	https://doi.org/10.1007/978-1-4939-1349-7
ISBN:	9781493913497

CMOS Test and Evaluation = A Physical Perspective /
Bhushan, Manjul.

CMOS Test and EvaluationA Physical Perspective /[electronic resource] :by Manjul Bhushan, Mark B. Ketchen. - 1st ed. 2015. - XIII, 424 p. 338 illus.online resource.

Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.

This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.

ISBN: 9781493913497

Standard No.: 10.1007/978-1-4939-1349-7doiSubjects--Topical Terms:

573603
Reliability.

LC Class. No.: TK7800-8360

Dewey Class. No.: 621.381

CMOS Test and Evaluation = A Physical Perspective /
LDR:02655nam a22004095i 4500 001 969779
003 DE-He213
005 20200630035521.0
007 cr nn 008mamaa
008 201211s2015 xxu| s |||| 0|eng d
020 $a 9781493913497 $9 978-1-4939-1349-7
024 7 $a 10.1007/978-1-4939-1349-7 $2 doi
035 $a 978-1-4939-1349-7
050 4 $a TK7800-8360
050 4 $a TK7874-7874.9
072 7 $a TJF $2 bicssc
072 7 $a TEC008000 $2 bisacsh
072 7 $a TJF $2 thema
082 0 4 $a 621.381 $2 23
100 1 $a Bhushan, Manjul. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 796339
245 1 0 $a CMOS Test and Evaluation $h [electronic resource] : $b A Physical Perspective / $c by Manjul Bhushan, Mark B. Ketchen.
250 $a 1st ed. 2015.
264 1 $a New York, NY : $b Springer New York : $b Imprint: Springer, $c 2015.
300 $a XIII, 424 p. 338 illus. $b online resource.
336 $a text $b txt $2 rdacontent
337 $a computer $b c $2 rdamedia
338 $a online resource $b cr $2 rdacarrier
347 $a text file $b PDF $2 rda
505 0 $a Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
520 $a This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
650 0 $a Reliability. $3 573603
650 0 $a Electronics. $3 596389
650 0 $a Microelectronics. $3 554956
650 0 $a Electronic circuits. $3 563332
650 0 $a Semiconductors. $3 578843
650 0 $a Quality control. $3 573723
650 0 $a Industrial safety. $3 568114
650 1 4 $a Electronics and Microelectronics, Instrumentation. $3 670219
650 2 4 $a Circuits and Systems. $3 670901
650 2 4 $a Quality Control, Reliability, Safety and Risk. $3 671184
700 1 $a Ketchen, Mark B. $4 aut $4 http://id.loc.gov/vocabulary/relators/aut $3 796340
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer Nature eBook
776 0 8 $i Printed edition: $z 9781493913480
776 0 8 $i Printed edition: $z 9781493913503
776 0 8 $i Printed edition: $z 9781493947027
856 4 0 $u https://doi.org/10.1007/978-1-4939-1349-7
912 $a ZDB-2-ENG
912 $a ZDB-2-SXE
950 $a Engineering (SpringerNature-11647)
950 $a Engineering (R0) (SpringerNature-43712)