Languages
Sadewasser, Sascha.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(Language materials, printed)
Kelvin probe force microscopy = from single charge detection to device characterization /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(Language materials, printed)
Kelvin Probe Force Microscopy = From Single Charge Detection to Device Characterization /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Subjects
Nanotechnology and Microengineering.
Thin films.
Thermodynamics.
Surfaces and Interfaces, Thin Films.
Microscopy.
Materials—Surfaces.
Spectroscopy.
Atomic force microscopy.
Engineering Thermodynamics, Heat and Mass Transfer.
Scanning probe microscopy.
Electrostatics
Measurement .
Characterization and Evaluation of Materials.
Nanotechnology.
Measurement Science and Instrumentation.
Physical measurements.
Spectroscopy and Microscopy.
Materials science.
Materials Science.
Physics.