Languages
Sadewasser, Sascha.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(Language materials, printed)
Kelvin probe force microscopy = from single charge detection to device characterization /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(Language materials, printed)
Kelvin Probe Force Microscopy = From Single Charge Detection to Device Characterization /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(Language materials, printed)
, [http://id.loc.gov/vocabulary/relators/edt]
Subjects
Nanotechnology and Microengineering.
Thin films.
Thermodynamics.
Surfaces and Interfaces, Thin Films.
Microscopy.
Materials—Surfaces.
Physical measurements.
Spectroscopy.
Atomic force microscopy.
Spectroscopy and Microscopy.
Materials science.
Materials Science.
Engineering Thermodynamics, Heat and Mass Transfer.
Scanning probe microscopy.
Physics.
Electrostatics
Measurement .
Characterization and Evaluation of Materials.
Nanotechnology.
Measurement Science and Instrumentation.