國立虎尾科技大學 |

Kelvin probe force microscopy = from single charge detection to device characterization /

Record Type:	Language materials, printed : Monograph/item
Title/Author:	Kelvin probe force microscopy/ edited by Sascha Sadewasser, Thilo Glatzel.
Reminder of title:	from single charge detection to device characterization /
other author:	Sadewasser, Sascha.
Published:	Cham :Springer International Publishing : : 2018.,
Description:	xxiv, 521 p. :ill., digital ; : 24 cm.;
Contained By:	Springer eBooks
Subject:	Atomic force microscopy. -
Online resource:	http://dx.doi.org/10.1007/978-3-319-75687-5
ISBN:	9783319756875

Kelvin probe force microscopy = from single charge detection to device characterization /
Kelvin probe force microscopyfrom single charge detection to device characterization /[electronic resource] :edited by Sascha Sadewasser, Thilo Glatzel. - Cham :Springer International Publishing :2018. - xxiv, 521 p. :ill., digital ;24 cm. - Springer series in surface sciences,v.650931-5195 ;. - Springer series in surface sciences ;48..

Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution -- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.

ISBN: 9783319756875

Standard No.: 10.1007/978-3-319-75687-5doiSubjects--Topical Terms:

655758
Atomic force microscopy.

LC Class. No.: QH212.A78 / K45 2018

Dewey Class. No.: 502.82

Kelvin probe force microscopy = from single charge detection to device characterization /
LDR:03025nam a2200337 a 4500 001 925346
003 DE-He213
005 20181015165020.0
006 m d
007 cr nn 008maaau
008 190625s2018 gw s 0 eng d
020 $a 9783319756875 $q (electronic bk.)
020 $a 9783319756868 $q (paper)
024 7 $a 10.1007/978-3-319-75687-5 $2 doi
035 $a 978-3-319-75687-5
040 $a GP $c GP
041 0 $a eng
050 4 $a QH212.A78 $b K45 2018
072 7 $a PNFS $2 bicssc
072 7 $a PDND $2 bicssc
072 7 $a SCI078000 $2 bisacsh
082 0 4 $a 502.82 $2 23
090 $a QH212.A78 $b K29 2018
245 0 0 $a Kelvin probe force microscopy $h [electronic resource] : $b from single charge detection to device characterization / $c edited by Sascha Sadewasser, Thilo Glatzel.
260 $a Cham : $c 2018. $b Springer International Publishing : $b Imprint: Springer,
300 $a xxiv, 521 p. : $b ill., digital ; $c 24 cm.
490 1 $a Springer series in surface sciences, $x 0931-5195 ; $v v.65
505 0 $a Part I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution -- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices.
520 $a This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
650 0 $a Atomic force microscopy. $3 655758
650 0 $a Scanning probe microscopy. $3 677829
650 0 $a Electrostatics $x Measurement. $3 888122
650 1 4 $a Physics. $3 564049
650 2 4 $a Spectroscopy and Microscopy. $3 768852
650 2 4 $a Surfaces and Interfaces, Thin Films. $3 671207
650 2 4 $a Nanotechnology and Microengineering. $3 722030
650 2 4 $a Characterization and Evaluation of Materials. $3 674449
650 2 4 $a Measurement Science and Instrumentation. $3 769080
700 1 $a Sadewasser, Sascha. $3 888119
700 1 $a Glatzel, Thilo. $3 888120
710 2 $a SpringerLink (Online service) $3 593884
773 0 $t Springer eBooks
830 0 $a Springer series in surface sciences ; $v 48. $3 888121
856 4 0 $u http://dx.doi.org/10.1007/978-3-319-75687-5
950 $a Physics and Astronomy (Springer-11651)