Atomic force microscopy.

Kelvin probe force microscopy = measuring and compensating electrostatic forces / by: (書目-語言資料,印刷品)

Atom probe microscopy / by: (書目-語言資料,印刷品)

The world of nano-biomechanics / by: (書目-語言資料,印刷品)

Conductive atomic force microscopy = applications in nanomaterials / by: (書目-語言資料,印刷品)

Polymer brush films with varied grafting and cross-linking density via SI-ATRP = analysis of the mechanical properties by AFM / by: (書目-語言資料,印刷品)

Kelvin probe force microscopy = from single charge detection to device characterization / by: (書目-語言資料,印刷品)

Atomic force microscopy in molecular and cell biology by: (書目-語言資料,印刷品)

Atomic force microscopy by: (書目-語言資料,印刷品)

Electrical atomic force microscopy for nanoelectronics by: (書目-語言資料,印刷品)

Nanoscale AFM and TEM observations of elementary dislocation mechanisms by: (書目-語言資料,印刷品)

Atomic force microscopy : = fundamental concepts and laboratory investigations / by: (書目-語言資料,印刷品)

Atomic force microscopy : = a new look at microbes / by: (書目-語言資料,印刷品)

Fundamentals and application of atomic force microscopy for food research by: (書目-語言資料,印刷品)