語系
Sadewasser, Sascha.
概要
| 作品: | 1 作品在 2 項出版品 1 種語言 | |
|---|---|---|
書目資訊
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(書目-語言資料,印刷品)
Kelvin probe force microscopy = from single charge detection to device characterization /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(書目-語言資料,印刷品)
Kelvin Probe Force Microscopy = From Single Charge Detection to Device Characterization /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
主題
Nanotechnology and Microengineering.
Thin films.
Thermodynamics.
Surfaces and Interfaces, Thin Films.
Microscopy.
Materials—Surfaces.
Spectroscopy.
Atomic force microscopy.
Engineering Thermodynamics, Heat and Mass Transfer.
Scanning probe microscopy.
Electrostatics
Measurement .
Characterization and Evaluation of Materials.
Nanotechnology.
Measurement Science and Instrumentation.
Physical measurements.
Spectroscopy and Microscopy.
Materials science.
Materials Science.
Physics.