語系
Sadewasser, Sascha.
概要
| 作品: | 1 作品在 2 項出版品 1 種語言 | |
|---|---|---|
書目資訊
Kelvin probe force microscopy = measuring and compensating electrostatic forces /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(書目-語言資料,印刷品)
Kelvin probe force microscopy = from single charge detection to device characterization /
by:
SpringerLink (Online service); Glatzel, Thilo.; Sadewasser, Sascha.
(書目-語言資料,印刷品)
Kelvin Probe Force Microscopy = From Single Charge Detection to Device Characterization /
by:
Sadewasser, Sascha.; Glatzel, Thilo.; SpringerLink (Online service)
(書目-語言資料,印刷品)
, [http://id.loc.gov/vocabulary/relators/edt]
主題
Nanotechnology and Microengineering.
Thin films.
Thermodynamics.
Surfaces and Interfaces, Thin Films.
Microscopy.
Materials—Surfaces.
Physical measurements.
Spectroscopy.
Atomic force microscopy.
Spectroscopy and Microscopy.
Materials science.
Materials Science.
Engineering Thermodynamics, Heat and Mass Transfer.
Scanning probe microscopy.
Physics.
Electrostatics
Measurement .
Characterization and Evaluation of Materials.
Nanotechnology.
Measurement Science and Instrumentation.