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Accelerating test, validation and de...
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Zilic, Zeljko.
Accelerating test, validation and debug of high speed serial interfaces
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Accelerating test, validation and debug of high speed serial interfaces/ by Yongquan Fan, Zeljko Zilic.
作者:
Fan, Yongquan.
其他作者:
Zilic, Zeljko.
出版者:
Dordrecht :Springer Science+Business media B.V., : 2011.,
面頁冊數:
xii, 194 p. :ill., digital ; : 24 cm.;
Contained By:
Springer eBooks
標題:
Interface circuits - Testing. -
電子資源:
http://dx.doi.org/10.1007/978-90-481-9398-1
ISBN:
9789048193981 (electronic bk.)
Accelerating test, validation and debug of high speed serial interfaces
Fan, Yongquan.
Accelerating test, validation and debug of high speed serial interfaces
[electronic resource] /by Yongquan Fan, Zeljko Zilic. - Dordrecht :Springer Science+Business media B.V.,2011. - xii, 194 p. :ill., digital ;24 cm.
ISBN: 9789048193981 (electronic bk.)Subjects--Topical Terms:
782310
Interface circuits
--Testing.
LC Class. No.: TK7868.I58 / F36 2011
Dewey Class. No.: 621.381548
Accelerating test, validation and debug of high speed serial interfaces
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