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VLSI test principles and architectures = design for testability /
Record Type:
Language materials, printed : Monograph/item
Title/Author:
VLSI test principles and architectures/ edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Reminder of title:
design for testability /
other author:
Wang, Laung-Terng.
Published:
Amsterdam ;Elsevier Morgan Kaufmann Publishers, : c2006.,
Description:
1 online resource (xxx, 777 p.) :ill. :
Subject:
Integrated circuits - Very large scale integration -
Online resource:
http://www.sciencedirect.com/science/book/9780123705976
ISBN:
9780123705976
VLSI test principles and architectures = design for testability /
VLSI test principles and architectures
design for testability /[electronic resource] :edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - Amsterdam ;Elsevier Morgan Kaufmann Publishers,c2006. - 1 online resource (xxx, 777 p.) :ill. - The Morgan Kaufmann series in systems on silicon. - Morgan Kaufmann series in systems on silicon..
Includes bibliographical references and index.
ISBN: 9780123705976Subjects--Topical Terms:
655640
Integrated circuits
--Very large scale integration
LC Class. No.: TK7874.75 / .V587 2006eb
Dewey Class. No.: 621.39/5
VLSI test principles and architectures = design for testability /
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VLSI test principles and architectures
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[electronic resource] :
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design for testability /
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edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
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Amsterdam ;
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Boston :
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Elsevier Morgan Kaufmann Publishers,
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c2006.
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1 online resource (xxx, 777 p.) :
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ill.
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The Morgan Kaufmann series in systems on silicon
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Includes bibliographical references and index.
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Description based on print version record.
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Integrated circuits
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Very large scale integration
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Wang, Laung-Terng.
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Wu, Cheng-Wen,
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Wen, Xiaoqing.
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ScienceDirect
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http://www.sciencedirect.com/science/book/9780123705976
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